Materials Analyst, Microscopy (Dual Beam FIB)

Added
18 hours ago
Type
Full time
Salary
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Related skills

sem materials science sample preparation tem electron microscopy

πŸ“‹ Description

  • Join Advanced Microscopy team in Phoenix, AZ to support materials and semiconductor analysis.
  • Run TEM lamella preparation using Dual Beam FIB-SEM systems on novel materials and devices.
  • Perform SEM imaging to aid navigation, prep, and quality verification.
  • Manage multiple client samples with quality standards and turnaround commitments.
  • Collaborate with team to optimize workflows and outputs.

🎯 Requirements

  • B.S. or M.S. in Materials Science & Engineering or related field, or equivalent hands-on
  • Hands-on experience with Dual Beam FIB-SEM systems, or strong academic/early-industry exposure with
  • Working knowledge of electron microscopy principles (SEM/TEM).
  • Understanding of semiconductor device physics and failure analysis concepts.
  • Strong problem-solving and prioritization in a fast-paced lab.

🎁 Benefits

  • Extensive hands-on tool time and exposure to advanced materials technologies.
  • Collaborative culture focused on technical excellence and improvement.
  • Evening shift structure with focused work and growth opportunities.
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