Materials Analyst, Microscopy (Dual Beam FIB)

📋 Description

• Preparing high-quality, site-specific TEM lamella using Dual Beam FIB-SEM systems on novel
• Performing SEM imaging to support sample navigation, preparation, and quality verification
• Managing multiple client samples, ensuring adherence to internal quality standards and turnaround
• Working closely with the team to optimize workflows, improve efficiency, and maintain consistent
• Collaborating with internal analytical teams and, as needed, clients to understand analysis

🎯 Requirements

• B.S. or M.S. in Materials Science & Engineering or related field, or equivalent hands-on
• Hands-on experience operating Dual Beam FIB-SEM systems, OR strong academic/early-industry exposure
• Working knowledge of electron microscopy principles (SEM/TEM)
• General understanding of semiconductor device physics and failure analysis concepts
• Strong problem-solving skills and the ability to manage priorities in a fast-paced, deadline-driven

🎁 Benefits

• Medical, Dental and Vision Coverage
• 401k Company Matching
• Paid Time Off
• Wellness Program
• Education Assistance
• Volunteer Time Off