Materials Scientist, Dual Beam Analysis

📋 Description

• Support FIB/SEM operation, including TEM lamella preparation and FIB-SEM/EDS analysis.
• Develop and implement automation workflows on Dual Beam (FIB/SEM) systems for lamella prep
• Maintain pipelines for FIB sample preparation, SEM imaging, and data acquisition.
• Perform image processing and analysis on 2D/3D FIB/SEM datasets.
• Improve throughput, repeatability, and data quality of Dual Beam services.
• Collaborate with cross-functional teams to solve failure analysis and materials characterization

🎯 Requirements

• MS or PhD in Materials Science and Engineering or related field or equivalent industrial experience.
• Must have in-depth knowledge of electron microscopy; Dual Beam (FIB/SEM) imaging.
• Expert with SEM/EDX, or TEM sample preparation.
• Solid understanding of semiconductor device physics and failure analysis (through previous work
• Excellent communication skills (written, verbal and presentation).
• Experience with semiconductor chip products and wafer samples is a plus.

🎁 Benefits

• Medical, Dental and Vision Insurance
• 401k Company Matching
• Wellness Program
• Volunteer Time off
• Education Assistance
• Fitness Reimbursement